Surface Atomic Force Microscopy (AFM) Engineer
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Requirements
- Here's what you'll need:
- B. S. to PhD in Materials Science, Electrical Engineering, Physics, Chemistry or closely related discipline.
- 3 or more years AFM analysis tool hands-on experience.
- Expertise in AFM instrument daily operation and data analysis required.
- Expertise in semiconductor cross-section preparation methods.
- Experience with CAFM, SSRM, SCM, AFM-IR, TERS, sMIM, KPFM.
- Understanding or expertise in other surface analysis techniques.
- Knowledge of semiconductor processes and device physics, solid background on materials physics and chemistry.
- Good communication and interpersonal skills.
- Previous analytical lab experience preferred.
- Excellent problem solving ability.
- Proficiency in Excel, PowerPoint, statistics software.
- Must be able to work for long periods sitting at instruments and handle small samples.
Benefits
Additional Information
About Samsung Austin Semiconductor Samsung is a world leader in advanced semiconductor technology, founded on the belief that the pursuit of excellence creates a better world. At Samsung Austin Semiconductor, we are Innovating Today to Power the Devices of Tomorrow. Come innovate with us! Position Summary The primary function of this position is to operate Atomic Force Microscopy instruments for analysis requests and provide timely high quality analysis reports to support process qualifications, Fab tool qualifications and mass production yield improvements. Includes collaborating closely with Fab Engineering and Process Integration groups to understand customer analysis needs and provide root cause analysis with data interpretation. Includes continuous improvement development for analysis techniques to meet needs of our customers on cutting edge technologies. Role and Responsibilities Here's What You'll Be Responsible For: Responsible for daily AFM instrument operation, analysis data acquisition, and providing timely, high quality analytical reports for fab process and tool qualification and for investigating process issues. Aid in root cause analysis and provide analysis solution logistics via AFM including surface topography characterization, nanomechanical properties, electrical characterization or other advanced AFM measurement mode. Able to recognize analysis improvement opportunities and lead projects in terms of quality, improving efficiency and adding new capabilities.
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