Work closely with the ATE engineer on yield improvement and analysis.
Develop ATE patterns, manage the hand-off process, and perform silicon debugging.
Participate in block and chip-level DFT implementation, developing and executing all related tasks.
Work on DFT lint checking, MBIST architecture, logic insertion, and scan insertion using industry-standard tools.
Perform ATPG and pattern simulation for both MBIST and scan.
Collaborate with the design, verification, and implementation teams during the DFT design phase, and with the ATE and product development teams during silicon bring-up.
Engage with various cross-functional team members, with opportunities to enhance our DFT design methodology.
Required Qualifications:
BSEE with 8+ years of relevant experience or MSEE with 6+ years of relevant experience.
Required experience in silicon bring-up and yield improvement.
Solid understanding of DFT techniques.
Proven experience in RTL lint checking, scan compression, scan insertion, and the ATPG process.
Experience in MBIST architecture and insertion.
Experience in analyzing and debugging simulation failures.
Solid understanding of digital logic fundamentals.
Strong knowledge of the Mentor Tessent/Synopsys DFT and simulation tool suite.
Proficiency with Perl or other scripting languages.
Strong communication and interpersonal skills.
Plus: Experience in STA constraint development in DFT modes
Additional Job Description:
Compensation and Benefits
The annual base salary range for this position is $108,000 - $192,000.
This position is also eligible for a discretionary annual bonus in accordance with relevant plan documents, and equity in accordance with equity plan documents and equity award agreements.
If you are located outside USA, please be sure to fill out a home address as this will be used for future correspondence.
Benefits
Dental insuranceVision insurance401(k)Paid time offEquity / stock optionsPerformance bonus
Additional Information
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Job Description:
As a member of our team, you will be responsible for various aspects of DFT, including MBIST and scan insertion, ATPG, ATE pattern development, and yield analysis.